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Under these conditions the scattered field is given by   exp(ikr ) Es ( r ) = −ikrF ( θ1 , θ2 , θ3 ) exp[ikϕ( x0 , y 0 )]dx0 dy 0 + Ee (r ) , 2 πr S0 (4) R (A 2 + B 2 + C 2 ) is a angle 2C factor; R - scattering coefficient; ϕ(x 0 , y 0 ) = Ax0 + By 0 + Ch(x 0 , y 0 ) is the phase function; Where k is the wave number of falling wave; F(θ1 , θ2 , θ3 ) = − h(x 0 , y 0 ) = z(x 0 , y 0 ) ; A = sin θ1 − sin θ2 cos θ3 ; C = − cos θ1 − cos θ2 ; B = − sin θ2 sin θ3 ;  R exp(ikr) Ee (r) = − ⋅ ( AI1 + BI 2 ) , C 4 πr Y I1 =  e ikϕ ( X ,y0 ) −Y (5) X I2 = ikϕ − X ,y − e ( 0 )  dy 0 ,   e ikϕ ( x0 ,Y ) −e ikϕ ( x0 , − Y ) −X  dx 0 .

20(1), 53-62. [2] Wilkinson, P. et al. (1997). Surface finish parameters as diagnostics of tool wear in face milling, Wear 25(1), 47-54. ' & Smith, E. H. (1986). The significance of surface topography in engineering. Precis. Eng. 8(2). 79-87. [4] Kaneami, J. & Hatazawa, T. (1989). Measurement of surface profiles bv the focus method. Wear 134, 221-229. [5] Mitsui, K. (1986). In-process sensors for surface roughness and their applications. Precis. Eng. 8(40), 212-220. [6] Baumgart , J. W. & Truckenbrodt H.

3) So, the rough surface in our model is described by function from six parameters: c w (or ), q , K , D, N , M . The influence of different parameters on a kind of a surface can be investigated analytically, and also studying structures of surfaces constructed by results of numerical accounts of Weierstrass function. Analysis of the surface profiles built by us on results of numeral calculations (fig. 2) due to the next conclusions: the wave number K sets length of a wave of the basic harmonic of a surface; the numbers N , M , D and q determine a degree of a surface calibration at the expense of imposing on the basic wave from additional harmonics, and N and M determine the number of harmonics, which are imposed; D determines amplitude of harmonics; q - both amplitude, and frequency of harmonics.

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